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EEPW首頁 > 測(cè)試測(cè)量 > 設(shè)計(jì)應(yīng)用 > 優(yōu)化基于PXI平臺(tái)的無線測(cè)試

優(yōu)化基于PXI平臺(tái)的無線測(cè)試

作者: 時(shí)間:2017-06-04 來源:網(wǎng)絡(luò) 收藏

本文引用地址:http://m.ptau.cn/article/201706/347995.htm

Larson Automation has developed an 802.11 board test station. This tester fully integrates the chip-set standard manufacturing test plan with engineering tools to control the test station and the Device Under Test (DUT) from a simple drill-down GUI interface. This system is used for production
testing, engineering evaluation, or for manufacturing a debug station. In this article, Wayne explains how Larson Automation conducted testing on the PXI platform.

在這篇文章里,作者介紹了Larson Automation 公司如何利用PXI平臺(tái)建立自動(dòng)化測(cè)試系統(tǒng)。全文請(qǐng)點(diǎn)擊:



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